Local Surface Modifications Investigated by Combining Scanning Electrochemical Microscopy and Surface-Enhanced Raman Scattering.

Abstract

Scanning electrochemical microscopy (SECM) is coupled with surface-enhanced Raman scattering (SERS) microscopy to characterize local surface modifications. SECM is utilized for the surface patterning of para-nitrothiophenol self-assembled monolayers (SAMs) in the direct mode of SECM with a subsequent readout of the chemical patterns by means of combined SECM-SERS. The SECM-SERS combination allows monitoring of local electrochemical processes and provides simultaneous complementary spectroscopic information. The reaction products upon SAM reduction, specifically p-aminothiophenol groups, are distinguished from the pristine SAM and locally ruptured areas.

• Authors: Jan Clausmeyer, Michaela Nebel, Stefanie Grützke, Yasin U Kayran, Wolfgang Schuhmann
• Journal: ChemPlusChem (Chempluschem) Vol. 83 Issue 5 Pg. 414-417 (May 2018) ISSN: 2192-6506 [Electronic] Germany
• PMID: 31957362 (Publication Type: Journal Article)
• Copyright: © 2018 Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim.