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Ultrafast response sensor to formaldehyde gas based on metal oxide.

Abstract
Thick film semiconductor gas sensors based on indium oxide were fabricated on Si substrate. The sensing materials on Si substrate were characterized using optical microscopy, X-ray diffraction (XRD) and scanning electron microscopy (SEM), and so on. They were very fine and uniform and we found out that particle sizes were about 20~30 nm through XRD analysis. Gas responses of fabricated sensors were measured in a chamber where gas flow was controlled by mass flow controller (MFC). Their resistance changes were monitored in real time by using data acquisition board and personal computer. Gas response characteristics were examined for formaldehyde (HCHO) gas which was known as the cause of sick building syndrome. Particularly, the sensors showed responses to formaldehyde gas at sub ppm (cf, standard of natural environment in building is about 80 ppb by ministry of environment in Korea), as a function of operating temperatures and gas concentrations. Also, we investigated sensitivity, repetition, selectivity, response speed and reproducibility of the sensors. The lowest detection limit is HCHO 25 ppb and sensitivity at 800 ppb is over 25% at 350 °C operating temperature. The response time (8 s) and recovery time (15 s) to HCHO gas at 200 ppb were very fast compared to other commercial products in flow type measurement condition. Repetition measurement was very good with ±3% in full measurement range. The fabricated metal oxide gas sensor showed good performance to HCHO gas and proved that it could be adaptable to indoor environment in building.
AuthorsN-J Choi, H-K Lee, S E Moon, J Kim, W S Yang
JournalJournal of nanoscience and nanotechnology (J Nanosci Nanotechnol) Vol. 14 Issue 8 Pg. 5807-10 (Aug 2014) ISSN: 1533-4880 [Print] United States
PMID25936006 (Publication Type: Journal Article, Research Support, Non-U.S. Gov't)
Chemical References
  • Metals
  • Oxides
  • Formaldehyde
Topics
  • Formaldehyde (analysis)
  • Limit of Detection
  • Metals (chemistry)
  • Microscopy, Electron, Scanning
  • Oxides (chemistry)
  • Reproducibility of Results
  • X-Ray Diffraction

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