Efficacy and safety of a low-energy double-pass 1450-nm diode laser for the treatment of acne scars.

Abstract

OBJECTIVE:

The purpose of this study was to evaluate the efficacy and safety of a 1450-nm diode laser on acne scars in Asian patients.

BACKGROUND DATA:

Acne and acne scars affect individuals during puberty and adolescence, and decrease their quality of life.

METHODS:

An open study was performed on 24 Japanese patients (17 female and 7 male, aged 15-44 years) with acne scars on the face treated with five sessions of low-energy double-pass 1450-nm diode laser at 4-week intervals. The mean duration of the acne scars prior to receiving laser therapy was 4.8 years (range 1-9). Clinical evaluation by physicians and with photographs was conducted at baseline, 1 month after the final treatment, and at a 3-month follow-up visit. Topical therapies for acne vulgaris were permitted during the follow-up period.

RESULTS:

All patients completed the five treatment sessions. Seventy-five percent of the subjects showed at least 30% improvement of acne scars. At the 3-month follow-up evaluation, 92.9% of the subjects with >30% improvement maintained the effectiveness. Vesicle formation and transient hyperpigmentation also occurred in one case.

CONCLUSIONS:

The 1450-nm diode laser therapy was effective and well-tolerated in patients with acne scars, suggesting that this may be an appropriate modality for treating facial acne scars.

• Authors: Tamae Wada, Akira Kawada, Ayaka Hirao, Haruyo Sasaya, Naoki Oiso
• Journal: Photomedicine and laser surgery (Photomed Laser Surg) Vol. 30 Issue 2 Pg. 107-11 (Feb 2012) ISSN: 1557-8550 [Electronic] United States
• PMID: 22133153 (Publication Type: Journal Article)

Topics

• Acne Vulgaris (complications)
• Adolescent
• Adult
• Asian People
• Cicatrix (etiology, radiotherapy)
• Female
• Humans
• Low-Level Light Therapy
• Male
• Skin (radiation effects)
• Treatment Outcome
• Young Adult